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Journal Publication

Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations

This publication appears in: IEEE Transactions on very large scale integration (VLSI) Systems

Authors: M. Simicic, P. Weckx, B. Parvais, P. Roussel, B. Kaczer and G. Gielen

Volume: 27

Issue: 3

Pages: 601-610

Publication Date: Mar. 2019

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Mr. Bertrand Parvais

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bparvais@etrovub.be

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