ETRO VUB
About ETRO  |  News  |  Events  |  Vacancies  |  Contact  
Home Research Education Industry Publications About ETRO

ETRO Publications

Full Details

Book Publication

Defect-based compact modeling of random telegraph noise

Host Publication: Noise in Nanoscale Semiconductor Devices

Authors: P. Weckx, B. Kaczer, M. Simicic, B. Parvais and D. Linten

Publisher: Springer International Publishing AG

Publication Date: Apr. 2020

Number of Pages: 16

ISBN: 9783030374990

Other Reference Styles
Current ETRO Authors

Mr. Bertrand Parvais

+32 (0)

bparvais@etrovub.be

more info

Other Publications

• Journal publications

IRIS • LAMI • AVSP

• Conference publications

IRIS • LAMI • AVSP

• Book publications

IRIS • LAMI • AVSP

• Reports

IRIS • LAMI • AVSP

• Laymen publications

IRIS • LAMI • AVSP

• PhD Theses

Search ETRO Publications

Author:

Keyword:  

Type:








- Contact person

- IRIS

- AVSP

- LAMI

- Contact person

- Thesis proposals

- ETRO Courses

- Contact person

- Spin-offs

- Know How

- Journals

- Conferences

- Books

- Vacancies

- News

- Events

- Press

Contact

ETRO Department

Tel: +32 2 629 29 30

©2022 • Vrije Universiteit Brussel • ETRO Dept. • Pleinlaan 2 • 1050 Brussels • Tel: +32 2 629 2930 (secretariat) • Fax: +32 2 629 2883 • WebmasterDisclaimer