Transient Radar Method: Novel Illumination and Blind Electromagnetic/Geometrical Parameter Extraction Technique for Multilayer Structures
This publication appears in: IEEE Transactions on Microwave Theory and Techniques
Authors: A. Pourkazemi, J. Stiens, M. Becquaert and M. Vandewal
Publication Date: Mar. 2017
A novel technique enabling ultrafast nondestructivecharacterization of multilayer dielectric structures is proposed.Actual estimations indicate that the data acquisition performanceof electronic measurement systems of today allow deep submillimeterdepth resolution, almost independently of the frequency.For a 10 GHz signal, e.g., this corresponds to significant subwavelengthdepth resolution. By means of a novel blind analysismethod of the time-dependent reflected electromagnetic (EM) signal,detailed information on the geometrical and EM parameterssuch as the complex valued dielectric permittivity and magneticsusceptibility of each layer of the structure can be extracted.We validate the novel technique for different materials in the10 GHz range and compare the results obtained with S-parametermeasurements in the 9.5㪢.5 GHz range using a vector networkanalyzer. We will discuss the impact of nonidealities on theaccuracy of the retrieved parameters. The novel technique has thepotential for deployment in a wide range of applications rangingfrom the piping industry, wind energy industry, automotive,biotechnology, food industry, pharmacy, and so on.