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2023
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ElKashlan, R, Khaled, A, Rodriguez, R, Sibaja-Hernandez, A, Peralagu, U, Alian, A, Collaert, N , Wambacq, P & Parvais, B 2023, ' RF linearity trade-offs for varying T-gate geometries of GaN HEMTs on Si ', International Journal of Microwave and Wireless Technologies , vol. 67, pp. 1-10.
ElKashlan, RY 2023, ' GaN-on-Si technology for modern wireless communication systems: Optimisation insight using RF characterisation ', Vrije Universiteit Brussel, Brussels.
2022
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Alian, A, Rodriguez, R, Yadav, S, Peralagu, U, Sibaja-Hernandez, A, Putcha, V, Zhao, M, ElKashlan, R, Vermeersch, B, Yu, H, Bury, E, Khaled, A, Collaert, N & Parvais, B 2022, Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer . in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC). European Solid-State Device Research Conference, vol. 2022-September, Institute of Electrical and Electronics Engineers Inc., pp. 384-387, IEEE 52nd European Solid-State Device Research Conference (ESSDERC), Milan, Italy, 19/09/22 .
ElKashlan, R, Khaled, A, Rodriguez, R, Yadav, S, Peralagu, U, Alian, A, Collaert, N , Wambacq, P & Parvais, B 2022, Channel Thickness Impact on the Small- and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier . in 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022. Institute of Electrical and Electronics Engineers Inc., Denver, CO, USA, pp. 910-913, Microwave, MTT-S International Symposium, Denver, Colorado, United States, 19/06/22 .
ElKashlan, R, Khaled, A, Rodriguez, R, Putcha, V, Peralagu, U, Alian, A, Collaert, N , Wambacq, P & Parvais, B 2022, Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation . in 2021 16th European Microwave Integrated Circuits Conference (EuMIC). EuMIC 2021 - 2021 16th European Microwave Integrated Circuits Conference, IEEE, pp. 30-33, European Microwave Week, London, United Kingdom, 2/04/22 .
Collaert, N, Alian, A, Banerjee, A, Boccardi, G, Cardinael, P, Chauhan, V, Desset, C, Elkashlan, R, Khaled, A, Ingels, M, Kunert, B, Mols, Y, O'Sullivan, B, Peralagu, U, Pinho, N, Rodriguez, R, Sibaja-Hernandez, A, Sinha, S, Sun, X, Vais, A, Vermeersch, B, Yadav, S , Yan, D , Yu, H, Zhang, Y, Zhao, M, Van Driessche, J, Gramegna, G , Wambacq, P , Parvais, B & Peeters, M 2022, III-V/III-N technologies for next generation high-capacity wireless communication . in 2022 International Electron Devices Meeting, IEDM 2022. Technical Digest - International Electron Devices Meeting, IEDM, vol. 2022-December, Institute of Electrical and Electronics Engineers Inc., pp. 1151-1154, 2022 International Electron Devices Meeting, IEDM 2022, San Francisco, United States, 3/12/22 .
Yu, H , Parvais, B , Peralagu, U, Elkashlan, RY, Rodriguez, R, Khaled, A, Yadav, S, Alian, A, Zhao, M, De Almeida Braga, N, Cobb, J, Fang, J, Cardinael, P, Sibaja-Hernandez, A & Collaert, N 2022, Back Barrier Trapping Induced Resistance Dispersion in GaN HEMT: Mechanism, Modeling, and Solutions . in 2022 International Electron Devices Meeting, IEDM 2022. 2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDM, Institute of Electrical and Electronics Engineers Inc., pp. 3061-3064, 2022 International Electron Devices Meeting, IEDM 2022, San Francisco, United States, 3/12/22 .
2021
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Parvais, B , Elkashlan, R, Yu, H, Sibaja-Hernandez, A, Vermeersch, B, Putcha, V, Cardinael, P, Rodriguez, R, Khaled, A, Alian, A, Peralagu, U, Zhao, M, Yadav, S, Gramegna, G, Driessche, JV & Collaert, N 2021, Transistor modelling for mm-Wave technology pathfinding . in SISPAD 2021 - 2021 International Conference on Simulation of Semiconductor Processes and Devices, Proceedings. International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, vol. 2021-September, Institute of Electrical and Electronics Engineers Inc., pp. 247-250, 26th International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2021, Dallas, United States, 27/09/21 .
Yadav, S, Vais, A, Elkashlan, RY, Witters, L, Vondkar, K, Mols, Y, Walke, A, Yu, H, Alcotte, R, Ingels, M , Wambacq, P , Langer, R, Kunert, B, Waldron, N , Parvais, B & Collaert, N 2021, DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates . in EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference. , 9337489, EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., pp. 89-92, 15th European Microwave Integrated Circuits Conference, EuMIC 2020, Utrecht, Netherlands, 11/01/21 .
2020
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Parvais, B , Alian, A, Peralagu, U, Rodriguez, R, Yadav, S, Khaled, A, Elkashlan, RY, Putcha, V, Sibaja-Hernandez, A, Zhao, M , Wambacq, P , Collaert, N & Waldron, N 2020, GaN-on-Si mm-wave RF devices integrated in a 200mm CMOS Compatible 3-Level Cu BEOL . in 2020 IEEE International Electron Devices Meeting, IEDM 2020. , 9372056, Technical Digest - International Electron Devices Meeting, IEDM, vol. 2020-December, Institute of Electrical and Electronics Engineers Inc., pp. 8.1.1-8.1.4, 66th Annual IEEE International Electron Devices Meeting, IEDM 2020, Virtual, San Francisco, United States, 12/12/20 .
Collaert, N, Alian, A, Banerjee, A, Chauhan, V, Elkashlan, RY, Hsu, B, Ingels, M, Khaled, A, Vondkar Kodandarama, K, Kunert, B, Mols, Y, Peralagu, U, Putcha, V, Rodriguez, R, Sibaja-Hernandez, A, Simoen, E, Vais, A, Walke, A, Witters, L, Yadav, S, Yu, H, Zhao, M , Wambacq, P , Parvais, B & Waldron, N 2020, From 5G to 6G: Will compound semiconductors make the difference? in S Yu, X Zhu & T-A Tang (eds), 2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings. , 9278253, 2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 15th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020, Virtual, Kunming, China, 3/11/20 .
Elkashlan, RY, Rodriguez, R, Yadav, S, Khaled, A, Peralagu, U, Alian, A, Waldron, N, Zhao, M , Wambacq, P , Parvais, B & Collaert, N 2020, ' Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTs ', IEEE Transactions on Electron Devices , vol. 67, no. 11, 9186848, pp. 4592-4596.
Parvais, B , Peralagu, U, Vais, A, Alian, A, Witters, L, Mols, Y, Walke, A, Ingels, M, Yu, H, Putcha, V, Khaled, A, Rodriguez, R, Sibaja-Hernandez, A, Yadav, S, Elkashlan, R, Baryshnikova, M, Mannaert, G, Alcotte, R, Kunert, B, Simoen, E, Zhao, E, De Jaeger, B, Fleetwood, D, Langer, R, Zhao, M , Wambacq, P , Waldron, N & Collaert, N 2020, ' (Invited) Advanced Transistors for High Frequency Applications ', ECS Transactions , vol. 97, no. 27, pp. 27-38.