Zhu, B., Vanloocke, S., Matvejev, V., Stiens, J., De Zutter, D., & Vounckx, R. (2011). Scanning Near-field Millimeter Wave Microscope Combining Dielectric Tapered Probes and Metal Tips. PIERS Online, 7, 536-539. http://www.piers.org/piersonline/download.php?file=MTEwMjE3MDMyNzM4fFZvbDdObzZQYWdlNTM2dG81MzkucGRm

@article{9879861bf3954fe4867d6d573c209a36,
title = "Scanning Near-field Millimeter Wave Microscope Combining Dielectric Tapered Probes and Metal Tips",
abstract = "In this paper, we built a free-space scattering-type scanning near-field millimeter wave microscope using two tapered dielectric probes facing each other and a sample in between based on MVNA. Nylon, Teflon and PVC dielectric tapered probes are compared in this system. We adopted a PVC probe and a Teflon probe as incident and receiving probes. The resolution is frequency dependent. In order to increase the resolution and contrast, we additionally positioned a metal probe tip between the dielectric tapered probe and the object under test. First experiment results on this signal improvement concept will be reported for a 2 um tungsten probe, yielding an increased field enhancement and leading to the contrast improvement",
keywords = "near field, millimeter wave, scaning microscope, scattering type",
author = "Bin Zhu and Sam Vanloocke and Vladimir Matvejev and Johan Stiens and {De Zutter}, Dani{\"e}l and Roger Vounckx",
year = "2011",
month = sep,
day = "16",
language = "English",
volume = "7",
pages = "536--539",
journal = "PIERS Online",
issn = "1931-7360",
note = "Unknown ; Conference date: 16-09-2011",
}