Parvais, B., Hu, S., Dehan, M., Mercha, A., & Decoutere, S. (2007). An Accurate Scalable Compact Model for the Substrate Resistance of RF MOSFETs. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007 (pp. 503-506). Article 4405781 (Proceedings of the Custom Integrated Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2007.4405781

@inproceedings{8a9e83e689494bbeab32a4e5f4a3d856,
title = "An Accurate Scalable Compact Model for the Substrate Resistance of RF MOSFETs",
abstract = "A new scalable compact model for the resistive substrate network of multi-finger MOSFETs is presented. The model is based on the transmission line formalism to capture the distributed nature of the well resistance. Due to its physical foundation, the model provides a more accurate description of different layout styles over a wide range of geometries. The model is validated experimentally on a 90 nm CMOS technology and is used to determine the geometry of RF transistors that minimize the substrate resistance. The opted network topology allows a direct implementation with the PSP model.",
author = "B. Parvais and S. Hu and M. Dehan and A. Mercha and S. Decoutere",
year = "2007",
month = jan,
day = "1",
doi = "10.1109/CICC.2007.4405781",
language = "English",
isbn = "1424407869",
series = "Proceedings of the Custom Integrated Circuits Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "503--506",
booktitle = "Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007",
address = "United States",
note = "29th Annual IEEE Custom Integrated Circuits Conference, CICC 2007 ; Conference date: 16-09-2007 Through 19-09-2007",
}