Millimeter wave imaging technology makes possible imaging of phenomena, which are inaccessible to visible light, but suffer from speckles, produced by coherent sources. We report a 50% speckle reduction, measured with a free-space vector network analyzer over the full W-band. Our experiments demonstrate how Hadamard mask operates as a tunable filter.
Jager, I, Stiens, J, Koers, G, Poesen, G, Vounckx, R & Science, WI (ed.) 2006, 'Hadamard speckle reduction for millimeter wave imaging', Microwave and Optical Technology Letters, vol. 48, no. 9, pp. 1722-1725. <http://www3.interscience.wiley.com/cgi-bin/abstract/112665000/ABSTRACT?CRETRY=1&SRETRY=0>
Jager, I., Stiens, J., Koers, G., Poesen, G., Vounckx, R., & Science, W. I. (Ed.) (2006). Hadamard speckle reduction for millimeter wave imaging. Microwave and Optical Technology Letters, 48(9), 1722-1725. http://www3.interscience.wiley.com/cgi-bin/abstract/112665000/ABSTRACT?CRETRY=1&SRETRY=0
@article{19d439dcf6b44402b8a1670006aba0e0,
title = "Hadamard speckle reduction for millimeter wave imaging",
abstract = "Millimeter wave imaging technology makes possible imaging of phenomena, which are inaccessible to visible light, but suffer from speckles, produced by coherent sources. We report a 50% speckle reduction, measured with a free-space vector network analyzer over the full W-band. Our experiments demonstrate how Hadamard mask operates as a tunable filter.",
keywords = "mm-wave imaging, speckle, Hadamard transform",
author = "Irina Jager and Johan Stiens and Gaetan Koers and Gert Poesen and Roger Vounckx and Science, {Wiley Inter}",
note = "Wiley Inter Science",
year = "2006",
month = jun,
day = "27",
language = "English",
volume = "48",
pages = "1722--1725",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "John Wiley and Sons Inc.",
number = "9",
}