Publication Details
Eddy Simoen, E. Simoen, Po Chun Brent Hsu, Hao Yu, Hongyue Wang, Ming Zhao, Kenichiro Takakura, Vamsi Putcha, Uthayasankaran Peralagu, Bertrand Parvais, Niamh Waldron, Nadine Collaert, Nadine Collaert

2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings

Contribution To Book Anthology


This paper describes the application of Deep Level Transient Spectroscopy and Generation-Recombination Noise Spectroscopy to the study of trap levels in III-V and III-N materials and devices.

DOI scopus