Publication Details
Overview
 
 
Eddy Simoen, E. Simoen, Po Chun Brent Hsu, Hao Yu, Hongyue Wang, Ming Zhao, Kenichiro Takakura, Vamsi Putcha, Uthayasankaran Peralagu, Bertrand Parvais, Niamh Waldron, Nadine Collaert, Nadine Collaert
 

2020 IEEE 15th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2020 - Proceedings

Contribution To Book Anthology

Abstract 

This paper describes the application of Deep Level Transient Spectroscopy and Generation-Recombination Noise Spectroscopy to the study of trap levels in III-V and III-N materials and devices.

Reference 
 
 
DOI scopus