Kilchytska, V., Kazemi Esfeh, B., Gimeno, C., Parvais, B., Planes, N., Haond, M., Raskin, J. P., & Flandre, D. (2017). Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs. In Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings (pp. 128-131). (Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ULIS.2017.7962581

@inproceedings{ab54d7b365b04b85aa67a7e4d45ff086,
title = "Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs",
keywords = "28 nm node, Fully depleted Silicon on Insulator (FDSOI), MOSFETs, harmonic distortion, measurements, non-linearity, simulations",
author = "V. Kilchytska and {Kazemi Esfeh}, B. and C. Gimeno and B. Parvais and N. Planes and M. Haond and Raskin, {J. P.} and D. Flandre",
year = "2017",
month = jun,
day = "29",
doi = "10.1109/ULIS.2017.7962581",
language = "English",
isbn = "9781509053131",
series = "Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "128--131",
booktitle = "Joint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 - Proceedings",
address = "United States",
note = "oint International EUROSOl Workshop and International Conference on Ultimate Integration on Silicon-ULIS, EUROSOI-ULIS 2017 ; Conference date: 26-06-2017 Through 30-06-2017",
}