Fabian Friederich, C. Matheis, J. Jonuscheit, R. Beigang, Edison Cristofani, M. Vandewal
A range of composite materials that contain glass fiber reinforced polymers is inspected for various defects such as debonds, delaminations and foreign inclusions with a terahertz FMCW imaging system. The results are evaluated manually and by means of semi-automatic image processing, which enhances the detection rate. Comparison with reference measurements from established NDT techniques shows high defect detectability with the terahertz approach.
Friederich, F, Matheis, C, Jonuscheit, J, Beigang, R, Cristofani, E & Vandewal, M 2014, Terahertz FMCW Inspection of GFRP Composites: Comparison with Conventional NDT Techniques and Enhanced Defect Detection Capability through Semi-automatic 3-D Image Processing. in 2014 IEEE MTT-S International Microwave Symposium Digest. Tampa Bay, FL, pp. 1-4, 2014 IEEE MTT-S International Microwave Symposium, IMS 2014, Tampa, FL, United States, 1/06/14.
Friederich, F., Matheis, C., Jonuscheit, J., Beigang, R., Cristofani, E., & Vandewal, M. (2014). Terahertz FMCW Inspection of GFRP Composites: Comparison with Conventional NDT Techniques and Enhanced Defect Detection Capability through Semi-automatic 3-D Image Processing. In 2014 IEEE MTT-S International Microwave Symposium Digest (pp. 1-4).
@inproceedings{192007c9d6c642a1b7cbef86a07c5c00,
title = "Terahertz FMCW Inspection of GFRP Composites: Comparison with Conventional NDT Techniques and Enhanced Defect Detection Capability through Semi-automatic 3-D Image Processing",
abstract = "A range of composite materials that contain glass fiber reinforced polymers is inspected for various defects such as debonds, delaminations and foreign inclusions with a terahertz FMCW imaging system. The results are evaluated manually and by means of semi-automatic image processing, which enhances the detection rate. Comparison with reference measurements from established NDT techniques shows high defect detectability with the terahertz approach.",
author = "Fabian Friederich and C. Matheis and J. Jonuscheit and R. Beigang and Edison Cristofani and M. Vandewal",
year = "2014",
language = "English",
isbn = "9783800735853",
pages = "1--4",
booktitle = "2014 IEEE MTT-S International Microwave Symposium Digest",
note = "2014 IEEE MTT-S International Microwave Symposium, IMS 2014 ; Conference date: 01-06-2014 Through 06-06-2014",
url = "http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6842514",
}