Publication Details
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Edison Cristofani, Marijke Vandewal
 

Chapter in Book/ Report/ Conference proceeding

Abstract 

This paper presents two well-known range migration algorithms applied to high-resolution Synthetic Aperture (SA) imaging in the relatively new subject of Non-Destructive Testing within the microwaves domain: the Range-Doppler and Time- Domain algorithms. SA processing yields improved cross-range resolutions and shows to be a powerful candidate among other non-invasive imaging techniques. The focus of this work is to start exploiting defect detection in 3D, in-depth imaging of multi-layered materials by using efficient SA processing. This paper shows successfully obtained 3D SA images of composite materials. Such promising results prove the validity of this technique and future uses can be foreseen in a vast variety of domains.

Reference