Wulleman, J 1996, '80M sample/s low powered. High-resolution comparator in radiation-hard SOI -bicmos technology', Electronics Letters, vol. 32, pp. 649-651.
Wulleman, J. (1996). 80M sample/s low powered. High-resolution comparator in radiation-hard SOI -bicmos technology. Electronics Letters, 32, 649-651.
@article{1b4ae4b3fe5343e7accf3e95d75066c7,
title = "80M sample/s low powered. High-resolution comparator in radiation-hard SOI -bicmos technology",
author = "Johan Wulleman",
note = "Electronics Letters, Vol. 32, PP. 649 - 651.",
year = "1996",
language = "English",
volume = "32",
pages = "649--651",
journal = "Electronics Letters",
issn = "0013-5194",
publisher = "Institution of Engineering and Technology",
}