A 5 bit 1.75 GS/s ADC using a factor 2 dynamic folding technique is presented. The 2X folding lowers the number of comparators from 31 to 16, simplifies encoding and reduces power consumption and area. The comparators in this converter are implemented with built-in references and calibration to further reduce power consumption. INL and DNL after calibration are smaller than 0.3 LSB, with an SNDR of 29.9 dB at low frequencies and above 27.5 dB up to the Nyquist frequency. The converter consumes 2.2 mW from a 1 V supply, yielding a FoM of 50 fJ per conversion step and occupies 0.02 mm^2 in a 90 nm 1P9M digital CMOS process.
Verbruggen, B, Craninckx, J, Kuijk, M, Wambacq, P & Van Der Plas, G 2009, 'A 2.2 mW 1.75 GS/s 5 Bit Folding Flash ADC in 90 nm Digital CMOS', IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 44, no. 3, pp. 874-882.
Verbruggen, B., Craninckx, J., Kuijk, M., Wambacq, P., & Van Der Plas, G. (2009). A 2.2 mW 1.75 GS/s 5 Bit Folding Flash ADC in 90 nm Digital CMOS. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 44(3), 874-882.
@article{5923b2f2c41d4447a212eef1220901b0,
title = "A 2.2 mW 1.75 GS/s 5 Bit Folding Flash ADC in 90 nm Digital CMOS",
abstract = "A 5 bit 1.75 GS/s ADC using a factor 2 dynamic folding technique is presented. The 2X folding lowers the number of comparators from 31 to 16, simplifies encoding and reduces power consumption and area. The comparators in this converter are implemented with built-in references and calibration to further reduce power consumption. INL and DNL after calibration are smaller than 0.3 LSB, with an SNDR of 29.9 dB at low frequencies and above 27.5 dB up to the Nyquist frequency. The converter consumes 2.2 mW from a 1 V supply, yielding a FoM of 50 fJ per conversion step and occupies 0.02 mm^2 in a 90 nm 1P9M digital CMOS process.",
keywords = "Analog-digital conversion, calibration, CMOS analog integrated circuits, comparators",
author = "Bob Verbruggen and J. Craninckx and Maarten Kuijk and Piet Wambacq and {Van Der Plas}, Geert",
year = "2009",
month = mar,
day = "1",
language = "English",
volume = "44",
pages = "874--882",
journal = "IEEE JOURNAL OF SOLID-STATE CIRCUITS",
issn = "0018-9200",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "3",
}