Stiens, J, Kotov, V, Shkerdin, G, Borghs, G & Vounckx, R 2002, Optical calibration of electron concentrations in heavily doped GaAs films. in Conference on Optoelectronic and Microelectronic Materials and Devices. Conference on Optoelectronic and Microelectronic Materials and Devices, pp. 459-462, Sydney, Australia., pp. 462, Unknown, 1/01/02.
Stiens, J., Kotov, V., Shkerdin, G., Borghs, G., & Vounckx, R. (2002). Optical calibration of electron concentrations in heavily doped GaAs films. In Conference on Optoelectronic and Microelectronic Materials and Devices (pp. 462). Conference on Optoelectronic and Microelectronic Materials and Devices, pp. 459-462, Sydney, Australia..
@inbook{e809772a8f1e498c845d1b97c48351dc,
title = "Optical calibration of electron concentrations in heavily doped GaAs films",
author = "Johan Stiens and Vladimir Kotov and Gennady Shkerdin and Gustaaf Borghs and Roger Vounckx",
note = "Conference on Optoelectronic and Microelectronic Materials and Devices, pp. 459-462, Sydney, Australia.; Unknown ; Conference date: 01-01-2002",
year = "2002",
language = "English",
pages = "462",
booktitle = "Conference on Optoelectronic and Microelectronic Materials and Devices",
publisher = "Conference on Optoelectronic and Microelectronic Materials and Devices, pp. 459-462, Sydney, Australia.",
}