Ph. Jansen, S. Thijs, Dimitri Linten, Mahadeva Iyer Natarajan, V. Vassilev, Mingxu Liu, A. Concannon, D. Tremouilles, T. Nakaie, M. Sawada, V. Vashchenko, M. Ter Beek, T. Hasebe, S. Decoutere, G. Groeseneken
ESD protection strategies utilized in RF circuit applications in CMOS and BiCMOS technologies are investigated and the results are presented in this paper. The conventional approach using diodes with power clamp is compared with novel approaches such as plug-and-play passive elements and full or partial circuit-ESD co-design. The trade-offs are discussed from both RF and ESD point of views. Common problems as parasitic ESD current discharge paths and voltage overshoot are discussed and solutions are proposed
Jansen, P, Thijs, S, Linten, D, Natarajan, MI, Vassilev, V, Liu, M, Concannon, A, Tremouilles, D, Nakaie, T, Sawada, M, Vashchenko, V, Ter Beek, M, Hasebe, T, Decoutere, S & Groeseneken, G 2005, RF ESD protection strategies - the design and performance trade-off challenges. in CICC, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, San Jose, CA, September 18-21, 2005. pp. 489-496, Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet, Stockholm, Sweden, 21/09/09.
Jansen, P., Thijs, S., Linten, D., Natarajan, M. I., Vassilev, V., Liu, M., Concannon, A., Tremouilles, D., Nakaie, T., Sawada, M., Vashchenko, V., Ter Beek, M., Hasebe, T., Decoutere, S., & Groeseneken, G. (2005). RF ESD protection strategies - the design and performance trade-off challenges. In CICC, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, San Jose, CA, September 18-21, 2005 (pp. 489-496)
@inproceedings{02ba921df96446dbaaacc1d33ac2c023,
title = "RF ESD protection strategies - the design and performance trade-off challenges",
abstract = "ESD protection strategies utilized in RF circuit applications in CMOS and BiCMOS technologies are investigated and the results are presented in this paper. The conventional approach using diodes with power clamp is compared with novel approaches such as plug-and-play passive elements and full or partial circuit-ESD co-design. The trade-offs are discussed from both RF and ESD point of views. Common problems as parasitic ESD current discharge paths and voltage overshoot are discussed and solutions are proposed",
keywords = "RF ESD, CMOS, BiCMOS",
author = "Ph. Jansen and S. Thijs and Dimitri Linten and Natarajan, {Mahadeva Iyer} and V. Vassilev and Mingxu Liu and A. Concannon and D. Tremouilles and T. Nakaie and M. Sawada and V. Vashchenko and {Ter Beek}, M. and T. Hasebe and S. Decoutere and G. Groeseneken",
year = "2005",
month = sep,
day = "18",
language = "English",
isbn = "0-7803-9023-7",
pages = "489--496",
booktitle = "CICC, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, San Jose, CA, September 18-21, 2005",
note = "Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet ; Conference date: 21-09-2009 Through 25-09-2009",
}