The present invention relates to a system for non-destructive analysis of a test material. The system includes an electromagnetic signal generator for generating and emitting an electromagnetic wave of substantially one frequency with a transient part through separate transmit antennas in different channels. A differential measurement module is configured for repetitive equivalent time sampling of transient signals received by corresponding antennas, using correlated clock signals. The system further includes a processing module for determining phase information from reference samples obtained from a reference material and for converting data samples from the test material into synchronous data samples with amplitude and phase information, using the phase information from the reference samples and predetermined operational data of the system. This enables the derivation of geometric information and/or electromagnetic properties of one or more layers of the test material.
Pourkazemi, A, Stiens, J, Thibaut, K & Akbarian, F, ASYNCHRONOUS TRANSIENT SIGNAL ANALYSIS, Patent No. EP4641180A1.
Pourkazemi, A., Stiens, J., Thibaut, K., & Akbarian, F. (2025). ASYNCHRONOUS TRANSIENT SIGNAL ANALYSIS. (Patent No. EP4641180A1).
@misc{7d39e92716f34655ac1bcabaad054112,
title = "ASYNCHRONOUS TRANSIENT SIGNAL ANALYSIS",
abstract = "The present invention relates to a system for non-destructive analysis of a test material. The system includes an electromagnetic signal generator for generating and emitting an electromagnetic wave of substantially one frequency with a transient part through separate transmit antennas in different channels. A differential measurement module is configured for repetitive equivalent time sampling of transient signals received by corresponding antennas, using correlated clock signals. The system further includes a processing module for determining phase information from reference samples obtained from a reference material and for converting data samples from the test material into synchronous data samples with amplitude and phase information, using the phase information from the reference samples and predetermined operational data of the system. This enables the derivation of geometric information and/or electromagnetic properties of one or more layers of the test material.",
author = "Ali Pourkazemi and Johan Stiens and Kato Thibaut and Fahimeh Akbarian",
year = "2025",
language = "English",
type = "Patent",
note = "EP4641180A1",
}