Voltage-to-time converters (VTCs) are critical components in time-domain (TD) analog-to-digital converters (ADCs). This paper addresses a gap in existing literature by analyzing noise in constant-slope (CS) VTCs. Noise contributions are examined across three operational phases: sampling, integration, and crossing-detection. Single-ended (SE) and common-mode (CM) integration approaches are compared, identifying the latter as effective in reducing noise. Moreover, it is shown that while the sampling and integration noise contributions are not affected by the VTC operating speed, faster VTCs suffer from a signal-to-noise ratio (SNR) degradation due to the crossing-detector (CD) noise contribution. Theoretical findings are validated through schematic-level simulations in a 22−nm FDSOI CMOS technology, observing agreement.
Gerardi, M, Lagos, J, Wambacq, P & Craninckx, J 2025, Noise Analysis of Constant-Slope Voltage-to-Time Converters. in 2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025. 2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025, IEEE, pp. 1-4, 2025 20th International Conference on PhD Research in Microelectronics and Electronics (PRIME), Taormina, Italy, 21/09/25. https://doi.org/10.1109/PRIME66228.2025.11203624
Gerardi, M., Lagos, J., Wambacq, P., & Craninckx, J. (2025). Noise Analysis of Constant-Slope Voltage-to-Time Converters. In 2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025 (pp. 1-4). (2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025). IEEE. https://doi.org/10.1109/PRIME66228.2025.11203624
@inproceedings{cbc3162037b34f2eb2ab98b5ad07faf9,
title = "Noise Analysis of Constant-Slope Voltage-to-Time Converters",
abstract = "Voltage-to-time converters (VTCs) are critical components in time-domain (TD) analog-to-digital converters (ADCs). This paper addresses a gap in existing literature by analyzing noise in constant-slope (CS) VTCs. Noise contributions are examined across three operational phases: sampling, integration, and crossing-detection. Single-ended (SE) and common-mode (CM) integration approaches are compared, identifying the latter as effective in reducing noise. Moreover, it is shown that while the sampling and integration noise contributions are not affected by the VTC operating speed, faster VTCs suffer from a signal-to-noise ratio (SNR) degradation due to the crossing-detector (CD) noise contribution. Theoretical findings are validated through schematic-level simulations in a 22−nm FDSOI CMOS technology, observing agreement.",
author = "Mattia Gerardi and Jorge Lagos and Piet Wambacq and Jan Craninckx",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 20th International Conference on PhD Research in Microelectronics and Electronics (PRIME), PRIME ; Conference date: 21-09-2025 Through 24-09-2025",
year = "2025",
month = oct,
day = "21",
doi = "10.1109/PRIME66228.2025.11203624",
language = "English",
isbn = "979-8-3315-0391-8",
series = "2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025",
publisher = "IEEE",
pages = "1--4",
booktitle = "2025 20th International Conference on PhD Research in Microelectronics and Electronics, PRIME 2025",
url = "https://prime-conference.org/",
}