Publication Details
Overview
 
 
Sven Boulanger, Sven Boulanger, Sven Boulanger, Hans Ingelberts, Hans Ingelberts, Hans Ingelberts, Thomas Van den Dries, Thomas Van den Dries, Thomas Van den Dries, Anas Gasser, Anas Gasser, Anas Gasser, Maarten Kuijk, Maarten Kuijk, Maarten Kuijk
 

Chapter in Book/ Report/ Conference proceeding

Abstract ■

Integrating an optical receiver in CMOS optimized for near infrared light (NIR) remains appealing but at the same time challenging due to the deep photon penetration depth. A novel implementation of a light detector is demonstrated in a 350 nm CMOS technology, whereby, through adding a majority current with associated electric field distribution in the silicon detection volume, photo-generated minority electrons get quickly guided to the center of this volume. In the center, a tiny PN junction collects the photo-electrons. The detection speed subsequently increases, NIR light is received with improved responsivity and the detector capacitance gets drastically reduced to femtofarad level. The latter improvement also increases signal-to-noise performance and can be used to trade-off with other design parameters to improve global performance of the opto-electronic system. An optical datacom receiver at 1 Gbps is demonstrated at NIR-wavelength for proving useful Current-Assisted Photodiode detector operation in an actual CMOS system.

Reference ■