Edison, C. C., Becquaert, M., Pandey, G., Vandewal, M., Deligiannis, N., & Stiens, J. (2016). Compressed sensing and defect-based dictionaries for characteristics extraction in mm-wave non-destructive testing. In International Conference on Infrared, Millimeter and Terahertz Wave: IRMMWTHz’16 (pp. 1-2). IEEE.

@inproceedings{a76c96aa4dce41e2af0ce992ea97d6b0,
title = "Compressed sensing and defect-based dictionaries for characteristics extraction in mm-wave non-destructive testing",
abstract = "In ultra-wideband non-destructive testing of large multilayered polymers, data collection and reduction can be achieved by applying compressed sensing techniques. In this work, using effective modelling of possible defects, such as air gaps between layers, we construct defect dictionaries and use them as support data for a signal similarity-based classifier, which will automatically extract the main characteristics of the inspected defect.",
keywords = "compressed sensing , Non-Destructive Testing, dictionary learning",
author = "Edison, \{Cristofani Caldero\} and Mathias Becquaert and Gokarna Pandey and Marijke Vandewal and Nikolaos Deligiannis and Johan Stiens",
year = "2016",
language = "English",
isbn = "978-1-4673-8486-5",
pages = "1--2",
booktitle = "International Conference on Infrared, Millimeter and Terahertz Wave",
publisher = "IEEE",
note = "International Conference on Infrared, Millimeter and Terahertz Wave : IRMMWTHz ; Conference date: 25-09-2016 Through 30-09-2016",
}