Successful interference artifact reduction in mm-wave images by multiangle illumination is presented. Imaging simulations were performed in a Fourier-domain coherent optics framework. Both the model and experimental results show that interference patterns highly depend on the illumination angles and can be reduced by simply processing the multiangle images
Zhang, L, Koers, G, Stiens, J & Chang, K (ed.) 2009, 'Interference artifact reduction by multiangle illumination in millimeter wave images: Model and experimental validation', Microwave and Optical Technology Letters, vol. 51, no. 8, pp. 1845-1848. <http://www3.interscience.wiley.com/journal/122384291/abstract>
Zhang, L., Koers, G., Stiens, J., & Chang, K. (Ed.) (2009). Interference artifact reduction by multiangle illumination in millimeter wave images: Model and experimental validation. Microwave and Optical Technology Letters, 51(8), 1845-1848. http://www3.interscience.wiley.com/journal/122384291/abstract
@article{52db568485bd4492b651516531c8b811,
title = "Interference artifact reduction by multiangle illumination in millimeter wave images: Model and experimental validation",
abstract = "Successful interference artifact reduction in mm-wave images by multiangle illumination is presented. Imaging simulations were performed in a Fourier-domain coherent optics framework. Both the model and experimental results show that interference patterns highly depend on the illumination angles and can be reduced by simply processing the multiangle images",
keywords = "millimeter wave imaging, multiangle imaging, interference reduction",
author = "Lixiao Zhang and Gaetan Koers and Johan Stiens and Kai Chang",
note = "Kai Chang",
year = "2009",
month = may,
day = "13",
language = "English",
volume = "51",
pages = "1845--1848",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "John Wiley and Sons Inc.",
number = "8",
}