Elhawil, A., Koers, G., Zhang, L., Stiens, J., & Vounckx, R. (2009). Reliable Method for Material Characterisation using a Quasi-Optical Free-Space Measurement in the W-Band. IET Science, Measurement & Technology, 3(1), 39-50. http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=ISMTCT000003000001000039000001&idtype=cvips&gifs=Yes

@article{39df6fdf47704d959e5083deae9b129f,
title = "Reliable Method for Material Characterisation using a Quasi-Optical Free-Space Measurement in the W-Band",
abstract = "This paper presents an extension to Nicolson, Ross and Weir (NRW) algorithm to retrieve the complex permittivity and permeability from both the reflection and transmission coefficients. This new numerical retrieval approach solves the phase ambiguity problem associated with the NRW algorithm. A free-space quasi-optical 2-port measurement setup is employed to obtain the scattering parameters of different samples in the W-band frequency range. The results of different samples with various thicknesses are presented. Advantages and limitations of the method are also discussed.",
keywords = "dielectric constant, complex permittivity, permeability, free-space method, NRW",
author = "Amna Elhawil and Gaetan Koers and Lixiao Zhang and Johan Stiens and Roger Vounckx",
year = "2009",
month = jan,
day = "1",
language = "English",
volume = "3",
pages = "39--50",
journal = "IET Science, Measurement & Technology",
issn = "1751-8822",
publisher = "Institution of Engineering and Technology",
number = "1",
}