Jager, I., Zhang, L., Stiens, J., Sahli, H., & Vounckx, R. (2007). Millimeter wave inspection of concealed objects, Microwave and Optical Technology Letters. Microwave and Optical Technology Letters, 49, 2733-2737.

@article{5bcf429534604491982495cea1c2b7a2,
title = "Millimeter wave inspection of concealed objects, Microwave and Optical Technology Letters",
abstract = "Imaging concealed objects with a millimeter-wave coherent beam is accompanied with speckle. Two tools were chosen to improve visibility of concealed objects for security or industrial inspection: a speckle contrast image (image processing tool) and a Hadamard diffuser (mechanical tool). We report more then 50% speckle reduction over the full W-band",
keywords = "millimeter-wave imaging, microwave sensors, nondestructive sensing, image processing",
author = "Irina Jager and Lixiao Zhang and Johan Stiens and Hichem Sahli and Roger Vounckx",
year = "2007",
month = nov,
language = "English",
volume = "49",
pages = "2733--2737",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "John Wiley and Sons Inc.",
}