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Bertrand Parvais, Bertrand Parvais, Antonio Cerdeira, Antonio Cerdeira, Dominique Schreurs, Dominique Schreurs, Jean Pierre Raskin, Jean Pierre Raskin
 

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Abstract 

The harmonic and intermodulation distortions of both fully-depleted (FD) and partially-depleted (PD) silicon-on-insulator (SOI) MOSFETs are studied. The analysis is based on the recently developed integral function method and the results are compared to a third-order Volterra model of the MOSFET. This modelling helps us to understand the non-linear mechanisms of the considered devices and to predict their frequency behaviour. The models are validated through large-signal network analyser measurements. The devices performances are discussed.

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