Soens, C., Crunelle, C., Wambacq, P., Vandersteen, G., Linten, D., Donnay, S., Rolain, Y., Kuijk, M., & Barel, A. (2003). RF performance degradation due to coupling of digital switching noise in lightly doped substrates. In 2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN (pp. 127-132). IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA.

@inproceedings{1a3743cacad647cd9f46048a6f181b05,
title = "RF performance degradation due to coupling of digital switching noise in lightly doped substrates",
abstract = "Coupling of digital switching noise to the silicon substrate can severely degrade the analog and RF performance in single-chip transceivers. To predict the degradation of the performance of RF circuits, modeling of the impact of substrate noise is absolutely necessary. Using measurements, this impact is modeled by the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output. This approach has been validated with measurements on a 0.25 mum CMOS low-noise amplifier (LNA) and reveals insight in the mechanism of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA",
author = "Charlotte Soens and C. Crunelle and Piet Wambacq and Gerd Vandersteen and Dimitri Linten and S. Donnay and Yves Rolain and Maarten Kuijk and Alain Barel",
note = "Southwest Symposium on Mixed-Signal Design, Las Vegas, NV, USA, 23-25 February 2003, pp. 127-132; Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet ; Conference date: 21-09-2009 Through 25-09-2009",
year = "2003",
month = feb,
day = "23",
language = "English",
isbn = "0-7803-7778-8",
pages = "127--132",
booktitle = "2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN",
publisher = "IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA",
}