Towards efficient ESD protection strategies for advanced 3D systems-on-chip
 
Towards efficient ESD protection strategies for advanced 3D systems-on-chip 
 
Shih-Hsiang Lin, Marko Simicic, Nicolas Pantano
 
Abstract 

2.5D/3D technologies require designers to reduce electrostatic discharge (ESD) protection of the internal I/O interfaces. To avoid over-design of ESD protection, designers require a more fundamental understanding of the ESD events that occur at this level. Here we present insights, practical guidelines and research directions for circuit designers and suppliers of bonding tools.