Report Joint Meeting of Coding & Analysis and Test & Quality Subgroups ■
Peter Schelkens,
Peter Schelkens, Youngseop Kim, Youngseop Kim, Alexis Tzannes, Alexis Tzannes, Chaker M. Larabi, Chaker M. Larabi, Thomas Richter, Thomas Richter, Shigetaka Ogawa, Shigetaka Ogawa