Defect-based compact modeling of random telegraph noise ■
Pieter Weckx, Pieter Weckx, Pieter Weckx, Ben Kaczer, Ben Kaczer, Ben Kaczer, Marko Simicic, Marko Simicic, Marko Simicic,
Bertrand Parvais,
Bertrand Parvais,
Bertrand Parvais, Dimitri Linten, Dimitri Linten, Dimitri Linten