Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
 
Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs ■
 
V. Kilchytska, B. Kazemi Esfeh, C. Gimeno, Bertrand Parvais, N. Planes, M. Haond, J. P. Raskin, D. Flandre