A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS
 
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS ■
 
Bertrand Parvais, Bertrand Parvais, Bertrand Parvais, Piet Wambacq, Piet Wambacq, Piet Wambacq, Abdelkarim Mercha, Abdelkarim Mercha, Abdelkarim Mercha, Diederik Verkest, Diederik Verkest, Diederik Verkest, Aaron Thean, Aaron Thean, Aaron Thean, Ken Sawada, Ken Sawada, Ken Sawada, Kazuki Nomoto, Kazuki Nomoto, Kazuki Nomoto, Tetsuya Oishi, Tetsuya Oishi, Tetsuya Oishi, Hiroaki Ammo, Hiroaki Ammo, Hiroaki Ammo
 
Abstract ■

A test monitor circuit for low-frequency noise characterization is demonstrated in 28nm CMOS technology. The circuit allows a fast evaluation of the low frequency noise performance of transistors, providing a digital output. The VCO-based quantizer used for analog to digital conversion is capable of converting signal of small amplitude, in the μV range. A good agreement between the results obtained with the proposed circuit and standard measurements techniques is obtained.