Compressed sensing mm-wave SAR for non-destructive testing applications using side information
 
Compressed sensing mm-wave SAR for non-destructive testing applications using side information 
 
Mathias Becquaert, Edison Cristofani, Gokarna Pandey, Marijke Vandewal, Johan Stiens, Nikos Deligiannis
 
Abstract 

This paper evaluates the applicability of an innovative strategy for applying compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.