Publication Details
Overview
 
 
J. P. Raskin, J. Laconte, A. Akheyar, C. Dupont, S. Adriaensen, A. Nève, M. Dehan, Bertrand Parvais, D. Vanhoenacker, L. Demeûs, P. Delatte, V. Dessard, D. Flandre
 

Contribution to specialist/vulgarizing publication

Abstract 

Based on an extensive review of research results on the material, process, device and circuit properties of thin-film fully-depleted (FD) SOI CMOS, our work demonstrates that such a process with channel lengths of about 1 μm may emerge as one of the most promising and mature contender for integrated microsystems which must operate under low-voltage low-power conditions, at microwave frequencies and/or in the temperature range 200-350°C. Moreover, CMOS-compatible microfabrication processes have been developed in order to build low cost, low power, low voltage MEMS for various applications in RF communications, biomedical engineering, domotic, etc.

Reference 
 
 
scopus