Heremans, P, Kuijk, M, Windisch, R, Vanderhaegen, J, De Neve, H, Vounckx, R & Borghs, G 1997, 'Angular spectroscopic analysis: an optical characterization technique for laterally oxidized AlGaAs layers', J. Appl. Phys., no. 10, pp. 5267.
Heremans, P., Kuijk, M., Windisch, R., Vanderhaegen, J., De Neve, H., Vounckx, R., & Borghs, G. (1997). Angular spectroscopic analysis: an optical characterization technique for laterally oxidized AlGaAs layers. J. Appl. Phys., (10), 5267.
@article{37d140e150c743efa67eafb58e819b59,
title = "Angular spectroscopic analysis: an optical characterization technique for laterally oxidized AlGaAs layers",
author = "P. Heremans and Maarten Kuijk and Reiner Windisch and J. Vanderhaegen and \{De Neve\}, Hans and Roger Vounckx and Gustaaf Borghs",
note = "Jour. of Appl. Physics, Vol. 82, Nr. 10, pp. 5265-5267.",
year = "1997",
language = "English",
pages = "5267",
journal = "J. Appl. Phys.",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "10",
}