Thijs, S., Borremans, J., Jansen, P., Linten, D., Scholz, M., Wambacq, P., & Groeseneken, G. (2008). Inductor-Based ESD Protection under CDM-like ESD Stress Conditions for RF Applications. In Proceedings of the IEEE 2008, Custom Integrated Circuits Conference (pp. 49-52)

@inproceedings{ec9277dfdeb84a498df291b2ccab2409,
title = "Inductor-Based ESD Protection under CDM-like ESD Stress Conditions for RF Applications",
abstract = "Charged device model (CDM) electrostatic discharge (ESD) stress is a major concern for inductor-based ESD protection strategies for RF circuits processed in advanced nano-CMOS technologies. The CDM robustness of such protection methodology is investigated in this paper based on very-fast transmission line pulse (VFTLP) measurements. Its applicability is discussed for future technologies and RF applications.",
keywords = "ESD, CDM, RF, Very-Fast Transmission Line Pulse",
author = "S. Thijs and Jonathan Borremans and P. Jansen and Dimitri Linten and M. Scholz and Piet Wambacq and G. Groeseneken",
year = "2008",
month = sep,
day = "21",
language = "English",
isbn = "978-1-4244-2018-6",
pages = "49--52",
booktitle = "Proceedings of the IEEE 2008, Custom Integrated Circuits Conference",
note = "Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet ; Conference date: 21-09-2009 Through 25-09-2009",
}