We examine the influence of scaling the GaN channel thickness from 100nm to 35nm on the RF performance for GaN HEMTs on Si with a cGaN back-barrier with gate lengths ranging from 70nm to 190nm. Thinner GaN channels notably improve the short channel effects. However, there is a degradation in the on-state performance associated with an increase in dispersion. These trade-offs translate to a ~33%, ~20% decline in fT,fMAX respectively, for 70nm devices. While the large-signal metrics, PSAT and PAE, at 6GHz drop by ~46% and ~18%, respectively. We also consider the lateral downscaling of the gate-to-drain and gate-to-source spacings, which proves beneficial in boosting PSAT, up to 3.4W/mm, by increasing the extrinsic transconductance by ~20%.
ElKashlan, R, Khaled, A, Rodriguez, R, Yadav, S, Peralagu, U, Alian, A, Collaert, N , Wambacq, P & Parvais, B 2022, Channel Thickness Impact on the Small- and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier . in 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022. Institute of Electrical and Electronics Engineers Inc., Denver, CO, USA, pp. 910-913, Microwave, MTT-S International Symposium, Denver, Colorado, United States, 19/06/22 .
ElKashlan, R., Khaled, A., Rodriguez, R., Yadav, S., Peralagu, U., Alian, A., Collaert, N. , Wambacq, P. , & Parvais, B. (2022). Channel Thickness Impact on the Small- and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier . In 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 (pp. 910-913). Institute of Electrical and Electronics Engineers Inc..
@inproceedings{f9573dcfd2ec4c8d86b0daf139f10fb1,
title = " Channel Thickness Impact on the Small- and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier " ,
abstract = " We examine the influence of scaling the GaN channel thickness from 100nm to 35nm on the RF performance for GaN HEMTs on Si with a cGaN back-barrier with gate lengths ranging from 70nm to 190nm. Thinner GaN channels notably improve the short channel effects. However, there is a degradation in the on-state performance associated with an increase in dispersion. These trade-offs translate to a ~33%, ~20% decline in fT,fMAX respectively, for 70nm devices. While the large-signal metrics, PSAT and PAE, at 6GHz drop by ~46% and ~18%, respectively. We also consider the lateral downscaling of the gate-to-drain and gate-to-source spacings, which proves beneficial in boosting PSAT, up to 3.4W/mm, by increasing the extrinsic transconductance by ~20%. " ,
keywords = " Gallium Nitride, HEMTs, power amplifiers (PAs), radio frequency " ,
author = " Rana ElKashlan and Ahmad Khaled and Raul Rodriguez and Sachin Yadav and Uthayasankaran Peralagu and AliReza Alian and Nadine Collaert and Piet Wambacq and Bertrand Parvais " ,
year = " 2022 " ,
month = aug,
day = " 29 " ,
doi = " 10.1109/IMS37962.2022.9865258 " ,
language = " English " ,
isbn = " 978-1-6654-9614-8 " ,
pages = " 910913 " ,
booktitle = " 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022 " ,
publisher = " Institute of Electrical and Electronics Engineers Inc. " ,
address = " United States " ,
note = " Microwave, MTT-S International Symposium : 2022 IEEE/MTT-S International Microwave Symposium, IMS 2022 Conference date: 19-06-2022 Through 24-06-2022 " ,
}