Scholz, M., Linten, D., Thijs, S., Sawada, M., Kakaei, T., Hasebe, T., Lafonteese, D., Vashchenko, V., Vandersteen, G., Hopper, P., & Groeseneken, G. (2009). On-wafer human metal model measurements for system-level ESD analysis. In 2009, 31st Electrical Overstress/Electrostatic Discharge Symposium. EOS/ESD 2009 Anaheim, Ca, USA, August 30 - September 4, 2009

@inproceedings{70196090fbdd4b48b54d9d9f5fe231b1,
title = "On-wafer human metal model measurements for system-level ESD analysis",
abstract = "An on-wafer human metal model ESD measurement setup with voltage and current waveform measurement capability is presented. Using this setup, typical ESD protection structures and ESD protected circuits are characterized. A correlation between device responses on system-level ESD compared to component-level ESD stress like human body model is found to depend strongly on the device type.",
keywords = "on-wafer human metal model, ESD measurement setup",
author = "M. Scholz and Dimitri Linten and S. Thijs and M. Sawada and T. Kakaei and T. Hasebe and D. Lafonteese and V. Vashchenko and Gerd Vandersteen and P. Hopper and G. Groeseneken",
year = "2009",
month = aug,
day = "30",
language = "English",
isbn = "978-1-58537-176-1",
booktitle = "2009, 31st Electrical Overstress/Electrostatic Discharge Symposium. EOS/ESD 2009 Anaheim, Ca, USA, August 30 - September 4, 2009",
note = "Unknown ; Conference date: 30-08-2009",
}