Van Der Tempel, W., Van Nieuwenhove, D., Grootjans, R., & Kuijk, M. (2008). A 1 * 64 complementary metal oxide semiconductor ranging sensor based on current-assisted photonic demodulators. International Journal of Intelligent Systems Technologies and Applications, 5(3-4), 237-245.

@article{3eb2e8161425444ba130b8eabd0ad6b3,
title = "A 1 * 64 complementary metal oxide semiconductor ranging sensor based on current-assisted photonic demodulators",
abstract = "A new complementary metal oxide semiconductor (CMOS) active pixel-ranging sensor is presented, realised as a 1 * 64 array of 30 microns * 30 microns lock-in pixels. The sensor is based on the Current-Assisted Photonic Demodulator (CAPD), implemented in a Standard CMOS 0.35 ? m technology. The ranging pixel achieves 75% Fill-Factor, 0.22 A W-1 total QE and a demodulation bandwidth up to 70 MHz, both at 860 nm light. Range-finding is achieved through Modulated Wave Time-Of-Flight (TOF) measurements with a modulation frequency of 20 MHz. Distance measurements are presented. This sensor represents the first step towards integrating CAPD-based lock-in pixels in large TOF CMOS ranging systems",
keywords = "CMOS image sensors, spatial variables measurement, Detection of radiation",
author = "{Van Der Tempel}, Ward and {Van Nieuwenhove}, Daniel and Riemer Grootjans and Maarten Kuijk",
year = "2008",
month = jan,
day = "1",
language = "English",
volume = "5",
pages = "237--245",
journal = "International Journal of Intelligent Systems Technologies and Applications",
issn = "1740-8865",
publisher = "Inderscience Publishers",
number = "3-4",
}