Weckx, P, Kaczer, B, Simicic, M, Parvais, B & Linten, D 2020, Defect-based compact modeling of random telegraph noise. in Noise in Nanoscale Semiconductor Devices. Springer International Publishing AG, pp. 517-532. https://doi.org/10.1007/978-3-030-37500-3_16
Weckx, P., Kaczer, B., Simicic, M., Parvais, B., & Linten, D. (2020). Defect-based compact modeling of random telegraph noise. In Noise in Nanoscale Semiconductor Devices (pp. 517-532). Springer International Publishing AG. https://doi.org/10.1007/978-3-030-37500-3_16
@inbook{887125991eb3426eaf89cfd6d5cd612e,
title = "Defect-based compact modeling of random telegraph noise",
author = "Pieter Weckx and Ben Kaczer and Marko Simicic and Bertrand Parvais and Dimitri Linten",
year = "2020",
month = apr,
day = "26",
doi = "10.1007/978-3-030-37500-3\_16",
language = "English",
isbn = "9783030374990",
pages = "517--532",
booktitle = "Noise in Nanoscale Semiconductor Devices",
publisher = "Springer International Publishing AG",
address = "Switzerland",
}