Parvais, B., Wambacq, P., Mercha, A., Verkest, D., Thean, A., Sawada, K., Nomoto, K., Oishi, T., & Ammo, H. (2016). A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS. In 2015 IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 - Proceedings (pp. 157-160). Article 7387446 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASSCC.2015.7387446

@inproceedings{f90388a3f5ff4064ab2cc2be7b416823,
title = "A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS",
abstract = "A test monitor circuit for low-frequency noise characterization is demonstrated in 28nm CMOS technology. The circuit allows a fast evaluation of the low frequency noise performance of transistors, providing a digital output. The VCO-based quantizer used for analog to digital conversion is capable of converting signal of small amplitude, in the μV range. A good agreement between the results obtained with the proposed circuit and standard measurements techniques is obtained.",
keywords = "CMOS characterization, flicker noise, noise measurement, sigma-delta converters, Test monitors, VCO-based quantizers",
author = "Bertrand Parvais and Piet Wambacq and Abdelkarim Mercha and Diederik Verkest and Aaron Thean and Ken Sawada and Kazuki Nomoto and Tetsuya Oishi and Hiroaki Ammo",
year = "2016",
month = jan,
day = "19",
doi = "10.1109/ASSCC.2015.7387446",
language = "English",
pages = "157--160",
booktitle = "2015 IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "11th IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 ; Conference date: 09-11-2015 Through 11-11-2015",
}