Becquaert, M., Edison, C. C., Pandey, G., Vandewal, M., Stiens, J., & Deligiannis, N. (2016). Compressed sensing mm-wave SAR for non-destructive testing applications using side information. In IEEE Radar Conference 2016 (pp. 1-5). IEEE.

@inproceedings{3e53456b14dd408d8a2489c02533d1e6,
title = "Compressed sensing mm-wave SAR for non-destructive testing applications using side information",
abstract = "This paper evaluates the applicability of an innovative strategy for applying compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.",
keywords = "Compressed sensing, Synthetic Aperture Radar, Non-Destructive Testing",
author = "Mathias Becquaert and Edison, {Cristofani Caldero} and Gokarna Pandey and Marijke Vandewal and Johan Stiens and Nikolaos Deligiannis",
year = "2016",
month = may,
language = "English",
pages = "1--5",
booktitle = "IEEE Radar Conference 2016",
publisher = "IEEE",
note = "2016 IEEE Radar Conference, RadarConf 2016 ; Conference date: 02-05-2016 Through 06-05-2016",
}