Publication Details
Overview
 
 
Jan Cornelis, Edgard Nyssen, Antonis Katartzis, Luc van Kempen, Piet Boekaerts, Rudi Deklerck, Alexandru Ioan Salomie
 

WCC 2000 - ICSP2000, World Computer Conference 2000 - 5th International Conference on Signal Processing Proceedings Beijing, China III/III Aug 2000.

Contribution To Book Anthology

Abstract 

Three classes of statistical techniques used to solve image segmentation and labelling problems are reviewed: (1) supervised and unsupervised pixel classification, (2) exploitation of the probability distribution map as a way to model image structure, (3) Markov random field modelling combined with MAP statistical classification. Diverse examples illustrate the potential of the three approaches that are described as generic methods belonging to a common framework for image segmentation/labelling

Reference