Publication Details
Jan Cornelis, Edgard Nyssen, Antonis Katartzis, Luc van Kempen, Piet Boekaerts, Rudi Deklerck, Alexandru Ioan Salomie

WCC 2000 - ICSP2000, World Computer Conference 2000 - 5th International Conference on Signal Processing Proceedings Beijing, China III/III Aug 2000.

Contribution To Book Anthology


Three classes of statistical techniques used to solve image segmentation and labelling problems are reviewed: (1) supervised and unsupervised pixel classification, (2) exploitation of the probability distribution map as a way to model image structure, (3) Markov random field modelling combined with MAP statistical classification. Diverse examples illustrate the potential of the three approaches that are described as generic methods belonging to a common framework for image segmentation/labelling