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2019 ■
Chen, C, He, G, Hauffman, T, Pletincx, S, De Tandt, C & Stiens, J 2019, 'Growth mechanism of novelty scaly CNFs@ZnO nanofibers structure and its photoluminescence property', Applied Surface Science, vol. 491, no. 0169-4332, pp. 75-82.
Chen, C, He, G, Zhang, Z, Yan, J, Kou, L, Hauffman, T, Pletincx, S, Zhao, W, Yun, J, De Tandt, C & Stiens, J 2019, 'Growth mechanism of novel scaly CNFs@ZnO nanofibers structure and its photoluminescence property', Applied Surface Science, vol. 491, pp. 75-82. https://doi.org/10.1016/j.apsusc.2019.06.112
 
2018 ■
Cristofani, E, Mahfoudia, O, Becquaert, M, Neyt, X, Horlin, F, Deligiannis, N, Stiens, J & Vandewal, M 2018, Exploring Side Information for DVB-t-based Passive Radars. in URSI Benelux Forum 2018. URSI, pp. 1-1, URSI Benelux Forum 2018, Delft, Netherlands, 25/01/18.
 
2011 ■
Zhu, B, Vanloocke, S, Stiens, J, De Zutter, D, Elhawil, A, De Tandt, C & Vounckx, R 2011, A Novel 3D Printed Focusing Probe in Scattering-type Scanning Near-field Millimeter & Terahertz Wave Microscope. in 5. European Conference on Antennas and Propagation, European Association on Antennas and Propagation, pp. 775-778, Unknown, 1/04/11.
 
2010 ■
Vandermeiren, W, Stiens, J, De Tandt, C, Shkerdin, G, Kotov, V, Borghs, G, Muys, P & Vounckx, R 2010, Thermal cross-talk reduction in IR thermo-electric photodetectors by lock-in method: 4D numerical simulations and experimental verification. in B Witzigmann, F Henneberger, Y Arakawa & M Osinski (eds), Proceedings of the SPIE - Physics and Simulation of Optoelectronic Devices XVIII. vol. 7597, Proceedings of the SPIE - Physics and Simulation of Optoelectronic Devices XVIII, SPIE, Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet, Stockholm, Sweden, 21/09/09.
 
2009 ■
Elhawil, A, Koers, G, Zhang, L, Stiens, J & Vounckx, R 2009, 'Comparison between two optimization algorithms to compute the complex permittivity of dielectric multilayer structures using a free space quasi-optical method in W-band', IET Science, Measurement & Technology, vol. 3, no. 1, pp. 13-21.